3

Modeling of the breakdown mechanisms for porous copper/low-k process flows

Year:
2007
Language:
english
File:
PDF, 656 KB
english, 2007
4

Backend dielectric breakdown dependence on linewidth and pattern density

Year:
2007
Language:
english
File:
PDF, 732 KB
english, 2007
5

Area Scaling for Backend Dielectric Breakdown

Year:
2010
Language:
english
File:
PDF, 6.02 MB
english, 2010
15

Colour-stripe permutation pattern for rapid structured-light range imaging

Year:
2012
Language:
english
File:
PDF, 2.61 MB
english, 2012